My teenager has implemented a world-class adaptive receiver!

With each customer visit, one clear emerging test trend is the need to remove, de-embed, or de-convolve the effects of an impaired channel, particularly for high-speed serial test. Although the fundamental concept is sound, there are some practical hurdles to performing this correctly. Here are a few techniques that can help you get better results with your de-embedding.

Board layout

De-embedding cannot compensate for a severely lossy channel. For the best results, the channel needs to have a quality design with matched impedances, low loss, and no large dips in the frequency response. Since the de-embedding transfer function is an inverse filter, a -60-dB dip in the frequency response would show up as amplified noise in the de-embedded results. Another approach to ease characterization of hard-to-access probe points is to create a replica channel that attempts to duplicate the real channel. In this case, use similar BGA pads if so implemented and SMP connectors if that is what’s on the other end.

To read the rest of this article please visit my Scope Guru on Signal Integrity Blog, on EDN’s site.

Explore posts in the same categories: Signal Integrity

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